Abstract: Cable failure caused by ablation of semi-conductive buffer layer of high voltage cable has received a lot of research attention. After the cable buffer layer applied to cable, there is no unified evaluation method, standard and device for electrical contact performance evaluation between insulation shielding layer and metal shielding layer of cable. A test method, electrical properties of gold cloth and common semi-conductive buffer layer could be tested at the same time was proposed, and corresponding testing device was developed. Influence of test voltage, test current, current density and test temperature on the contact resistance coefficient were studied, and stability of test results was tested. Results showed that test voltage, current, and current density should be set within a reasonable range, too large or too small had great influence on the test results, resulting in unstable test results, which could provide convenience for the subsequent engineering site and testing, and provide data support for the formulation of subsequent standards.